论文标题
使用两个光子吸收 - 瞬态电流技术研究分段传感器的技术
Techniques for the investigation of segmented sensors using the Two Photon Absorption -- Transient Current Technique
论文作者
论文摘要
两种光子吸收 - 瞬态电流技术（TPA -TCT）用于研究带有从顶部照明的硅条检测器。以被动条CMOS检测器为例，对分段设备的TPA-TCT进行了TPA-TCT的测量和分析技术。显示了激光束剪切和反射的影响，并介绍并成功使用了一种允许对电场研究的强度相关效应的方法。此外，还引入了镜像技术，该技术利用了金属的背面的反射，以在顶部金属化下方直接下方的测量值，同时从顶部照亮。
The Two Photon Absorption - Transient Current Technique (TPA-TCT) was used to investigate a silicon strip detector with illumination from the top. Measurement and analysis techniques for the TPA-TCT of segmented devices are presented and discussed using a passive strip CMOS detector as an example. The influence of laser beam clipping and reflection is shown and a method that allows to compensate these intensity related effects for the investigation of the electric field is introduced and successfully employed. Besides, the mirror technique is introduced, which exploits reflection at a metallised back side to enable the measurement directly below a top metallisation, while illuminating from the top.
