论文标题

将终极深度带入扫描隧道显微镜:金属中埋入纳米对象的深度地下视觉

Bringing ultimate depth to scanning tunnelling microscopy: deep subsurface vision of buried nano-objects in metals

论文作者

Kurnosikov, Oleg, Sicot, Muriel, Gaudry, Emilie, Pierre, Danielle, Lu, Yuan, Mangin, Stéphane

论文摘要

已经开发了一种基于扫描调节显微镜/光谱(STM/STS)的隐藏地下纳米结构的地下可视化和表征的方法。埋在金属表面下的纳米对象可以通过金属表面可视化几十纳米,并用STM表征而不会破坏样品。这种非破坏性方法利用量子井(QW)状态是由表面和埋入纳米对象之间的部分电子限制形成的。 STM的特异性允许纳米对象被选出并易于访问。然后,可以通过分析样品表面上电子密度的空间分布和振荡行为来确定它们的形状,大小和埋葬深度。通过制造嵌入单晶Cu矩阵中的氩纳米簇来证明概念证明。利用特定的电子带结构Cu和内部电子聚焦,我们在实验上证明了几种纳米的贵族纳米簇,可以检测,表征和成像,掩埋在80 nm的深处。该能力的ULTime深度估计为110 nm。这种使用QW状态的方法为增强金属表面下方的纳米结构的增强的3D表征铺平了道路。

A method for subsurface visualization and characterization of hidden subsurface nano-structures based on Scanning Tuneling Microscopy/Spectroscopy (STM/STS) has been developed. The nano-objects buried under a metal surface up to several tens of nanometers can be visualized through the metal surface and characterized with STM without destroying the sample. This non-destructive method exploits quantum well (QW) states formed by partial electron confinement between the surface and buried nano-objects. The specificity of STM allows for nano-objects to be singled out and easily accessed. Then, their shape, size and burial depth can be determined by analyzing the spatial distribution and oscillatory behavior of the electron density at the surface of the sample. The proof of concept was demonstrated by fabricating argon nanoclusters embedded into a single-crystalline Cu matrix. Taking advantage of the specific electronic band structure Cu and inner electron focusing, we experimentally demonstrated that noble-gas nanoclusters of several nanometers large buried as deep as 80 nm can be detected, characterized and imaged. The ultime depth of this ability is estimated as 110 nm. This approach using QW states paves the way for an enhanced 3D characterization of nanostructures hidden well below a metallic surface.

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