论文标题
金属单核化异质结构中的厚度和扭曲角度依赖的层间激子
Thickness and twist angle dependent interlayer excitons in metal monochalcogenide heterostructures
论文作者
论文摘要
层间激子或结合的电子孔对,其组成型准颗粒位于不同的堆叠半导体层中,正在在两个维半导体的异质层中进行深入研究。它们的存在归功于两层将它们转换为P-N连接的固有的II型带对齐。在这里,我们在金属单核化物的杂波中推出了一个明显的层间激子(IX),即epsilon-gase上的伽玛 - 伽玛,其明显的发射仅通过改变其厚度,鉴于其层依赖于直接频带的层。时间依赖的光致光谱光谱学揭示了相对于内层的层中层中的寿命更长,从而证实了它们的性质。线性恒定效应产生一个结合的电子孔对,其分离D仅为(3.6 \ pm 0.1)Å,D非常接近DSE =3.4Å,这是计算出的界面SE分离。 IX的包膜是扭曲角的依赖性的,可以通过叠加的排放来描述,这些排放几乎在能量上均几乎相等,就好像是由于小Moiré周期性引起的定位而量化的。这些异质链接的特征是极其平坦的界面价带,使其成为观察磁力或其他相关电子相的主要候选者。
Interlayer excitons, or bound electron-hole pairs whose constituent quasiparticles are located in distinct stacked semiconducting layers, are being intensively studied in heterobilayers of two dimensional semiconductors. They owe their existence to an intrinsic type-II band alignment between both layers that convert these into p-n junctions. Here, we unveil a pronounced interlayer exciton (IX) in heterobilayers of metal monochalcogenides, namely gamma-InSe on epsilon-GaSe, whose pronounced emission is adjustable just by varying their thicknesses given their number of layers dependent direct bandgaps. Time-dependent photoluminescense spectroscopy unveils considerably longer interlayer exciton lifetimes with respect to intralayer ones, thus confirming their nature. The linear Stark effect yields a bound electron-hole pair whose separation d is just (3.6 \pm 0.1) Å with d being very close to dSe = 3.4 Å which is the calculated interfacial Se separation. The envelope of IX is twist angle dependent and describable by superimposed emissions that are nearly equally spaced in energy, as if quantized due to localization induced by the small moiré periodicity. These heterostacks are characterized by extremely flat interfacial valence bands making them prime candidates for the observation of magnetism or other correlated electronic phases upon carrier doping.