论文标题
同时对掺杂剂和自由电荷载体进行茎的成像
Simultaneous imaging of dopants and free charge carriers by STEM-EELS
论文作者
论文摘要
固体中的掺杂不均匀性并不罕见,但是由于缺乏高度的空间和光谱分辨率的散装敏感实验技术,它们的显微镜观察和理解受到限制。在这里,我们使用高分辨率电子损失光谱(EELS)在LA掺杂的BASNO3(BLSO)中展示了掺杂剂和自由电荷载体的纳米级成像。通过分析鳗鱼中的高能量激发,我们揭示了单个BLSO纳米晶体中的化学和电子不均匀性。不均匀的掺杂导致独特的局部红外表面等离子体,包括一种高度限制在高掺杂区域之间的新型等离子体模式。我们进一步量化了BLSO的大块单晶的鳗鱼数据和传输测量值的载体密度,有效的质量和掺杂剂激活百分比。这些结果代表了研究固体中异质性,了解纳米级的结构 - 特性关系的独特方法,并为利用纳米级掺杂纹理的方式开辟了道路。
Doping inhomogeneities in solids are not uncommon, but their microscopic observation and understanding are limited due to the lack of bulk-sensitive experimental techniques with high-enough spatial and spectral resolution. Here, we demonstrate nanoscale imaging of both dopants and free charge carriers in La-doped BaSnO3 (BLSO) using high-resolution electron energy-loss spectroscopy (EELS). By analyzing both high- and low-energy excitations in EELS, we reveal chemical and electronic inhomogeneities within a single BLSO nanocrystal. The inhomogeneous doping leads to distinctive localized infrared surface plasmons, including a novel plasmon mode that is highly confined between high- and low-doping regions. We further quantify the carrier density, effective mass, and dopant activation percentage from EELS data and transport measurements on the bulk single crystals of BLSO. These results represent a unique way of studying heterogeneities in solids, understanding structure-property relationships at the nanoscale, and opening the way to leveraging nanoscale doping texture in the design of nanophotonic devices.