论文标题
综合征衍生的错误率作为量子硬件的基准
Syndrome-Derived Error Rates as a Benchmark of Quantum Hardware
论文作者
论文摘要
量子误差校正代码的设计目的是确切指出量子电路中何时何地发生错误。此功能是其主要任务的基础：支持容忍故障的量子计算。但是，此功能可以用作基准测试的基础：通过分析即使是小规模的量子误差校正电路的输出，可以构建详细的图片，该图像在量子设备上通过误差过程构建。在这里，我们使用小的重复代码的结果来执行此类分析的示例，以确定每个量子的错误率，而在综合征测量过程中闲置时。这提供了一个想法，即Qubits在设备上遇到的错误，而它们是我们期望在容忍故障的量子计算机中典型的电路的一部分。
Quantum error correcting codes are designed to pinpoint exactly when and where errors occur in quantum circuits. This feature is the foundation of their primary task: to support fault-tolerant quantum computation. However, this feature could used as the basis of benchmarking: By analyzing the outputs of even small-scale quantum error correction circuits, a detailed picture can be constructed of error processes across a quantum device. Here we perform an example of such an analysis, using the results of small repetition codes to determine the error rate of each qubit while idle during a syndrome measurement. This provides an idea of the errors experienced by the qubits across a device while they are part of the kind of circuit that we expect to be typical in fault-tolerant quantum computers.
