论文标题
AFIA:ATPG引导的故障注射攻击对安全逻辑锁定
AFIA: ATPG-Guided Fault Injection Attack on Secure Logic Locking
论文作者
论文摘要
集成电路的设计和制造的外包引起了人们对知识产权和非法生产非法生产的盗版的严重关注。逻辑锁定已成为一种混淆技术,以保护外包芯片设计,其中电路网列被锁定,只有在编程了安全键后才能实用。但是,基于布尔的可满足性攻击已证明会打破逻辑锁定,同时激励研究人员开发更安全的对策。在本文中,我们提出了一种新颖的断层注射攻击,以打破依赖一个存储的秘密钥匙的任何锁定技术,并将这种攻击表示为AFIA,ATPG引导的断层注射攻击。提出的攻击是基于对主要输出的关键位,同时在其他几条密钥线上注入故障,以阻止目标密钥位的传播。 AIFA非常有效地确定一个钥匙位,因为存在卡住的故障模式,该模式在任何钥匙线处检测到catuck-at 1(或stuck-at 0)故障。 AFIA注射故障数量的平均复杂性与关键大小是线性的,仅需要| k |确定秘密键的测试模式,K。Afia需要更少的注射故障,以使对主要输出的敏感性,而差分故障分析攻击[26],与2 | K | -1故障相比。
The outsourcing of the design and manufacturing of integrated circuits has raised severe concerns about the piracy of Intellectual Properties and illegal overproduction. Logic locking has emerged as an obfuscation technique to protect outsourced chip designs, where the circuit netlist is locked and can only be functional once a secure key is programmed. However, Boolean Satisfiability-based attacks have shown to break logic locking, simultaneously motivating researchers to develop more secure countermeasures. In this paper, we present a novel fault injection attack to break any locking technique that relies on a stored secret key, and denote this attack as AFIA, ATPG-guided Fault Injection Attack. The proposed attack is based on sensitizing a key bit to the primary output while injecting faults at a few other key lines that block the propagation of the targeted key bit. AIFA is very effective in determining a key bit as there exists a stuck-at fault pattern that detects a stuck-at 1 (or stuck-at 0) fault at any key line. The average complexity of number of injected faults for AFIA is linear with the key size and requires only |K| test patterns to determine a secret key, K. AFIA requires a fewer number of injected faults to sensitize a bit to the primary output, compared to 2|K|-1 faults for the differential fault analysis attack [26].