论文标题

氟化石墨烯基材料的灵活性

Flexibility of Fluorinated Graphene-Based Materials

论文作者

Antonova, I. V., Nebogatikova, N. A., Zerrouki, N., Kurkina, I. I., Ivanov, A. I.

论文摘要

研究了由于弯曲变形而导致的弯曲和压缩菌株,含有氟化石墨烯(FG)薄片(FG)(FG)(FG)的不同薄膜和化学蒸气沉积(CVD)的电阻率。通过层压层将通过CVD方法生长的石墨烯和多层石墨烯膜通过层压转移到柔性底物上,并受到氟化。他们表现出弱氟化度(f/c降低20%)。在这两种情况下,电阻率都会降低压缩菌株(一个两个数量级),这很可能与通过氟化石墨烯形成其他导电路径相关。两种类型的CVD生长FG的弯曲导致电阻率的恒定值或在重复应变周期下的电阻率不可逆小的增加导致电阻率的恒定值引起的拉伸应变高达3%。如果结构上印刷在聚乙烯醇上的FG薄膜,则观察到稳定的双极电阻开关,最多可占拉伸应变的6.5%(弯曲半径为2 mm)。拉伸应变下的横梁备忘录结构的出色性能表明,悬架产生的FG膜和结构对于柔性电子设备特别有希望。

The resistivity of different films and structures containing fluorinated graphene (FG) flakes and chemical vapor deposition (CVD) grown graphene of various fluorination degrees under tensile and compressive strains due to bending deformations was studied. Graphene and multilayer graphene films grown by means of the CVD method were transferred onto the flexible substrate by laminating and were subjected to fluorination. They demonstrated a weak fluorination degree (F/C lower 20%). Compressive strains led to a strong (one-two orders of magnitude) decrease in the resistivity in both cases, which was most likely connected with the formation of additional conductive paths through fluorinated graphene. Tensile strain up to 3% caused by the bending of both types of CVD-grown FG led to a constant value of the resistivity or to an irreversible increase in the resistivity under repeated strain cycles. In the case of the structures with the FG thin film printed on polyvinyl alcohol, a stable bipolar resistive switching was observed up to 6.5% of the tensile strain (bending radius was 2 mm). The excellent performance of the crossbar memristor structures under tensile strain shows that the FG films and structures created from suspension are especially promising for flexible electronics.

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