论文标题
从散装bi $ _2 $ se $ _3 $薄膜中，一种新型的回旋共振来自电荷爆发散射
A new type of cyclotron resonance from charge-impurity scattering in the bulk-insulating Bi$_2$Se$_3$ thin films
论文作者
论文摘要
这项工作着重于构造拓扑拓扑绝缘子BI $ _2 $ SE $ _3 $电影的低频drude响应。通过时间域Terahertz光谱法同时测量迁移率和载体密度的频率和场依赖性。这些电影是在缓冲层上生长的，被SE封顶，并在空中暴露了几个月。在高达7台特斯拉的磁场下，我们观察到显着的回旋共振（CRS）。我们将锋利的CR归因于膜的两个表面的两个不同的拓扑表面状态（TSS）。由于电子障碍散射，CR在高场上锐化。通过使用Magneto-Terahertz光谱法，我们确认这些膜是散装的构造，这铺平了使用固有拓扑绝缘子，没有散装载体，用于应用拓扑旋转和量子计算。
This work focuses on the low frequency Drude response of bulk-insulating topological insulator Bi$_2$Se$_3$ films. The frequency and field dependence of the mobility and carrier density are measured simultaneously via time-domain terahertz spectroscopy. These films are grown on buffer layers, capped by Se, and have been exposed in air for months. Under a magnetic field up to 7 Tesla, we observe prominent cyclotron resonances (CRs). We attribute the sharp CR to two different topological surface states (TSSs) from both surfaces of the films. The CR sharpens at high fields due to an electron-impurity scattering. By using magneto-terahertz spectroscopy, we confirm that these films are bulk-insulating, which paves the way to use intrinsic topological insulators without bulk carriers for applications including topological spintronics and quantum computing.
