论文标题

顺序测量中的量子反向效应

Quantum backaction effects in sequential measurements

论文作者

Ho, Le Bin

论文摘要

量子反向是指测量量子系统的干扰。在顺序测量中,这种效果可以积累并变得重要,从而导致系统状态的不平凡修改和测量结果。本文探讨了量子背部在顺序测量中表现出的方​​式,包括测量强度的作用和测量过程的性质。本文突出了洞察量子基础以及对量子测量和信息处理的影响。

Quantum backaction refers to the disturbance of a quantum system caused by measuring it. In sequential measurements, this effect can accumulate and become significant, leading to nontrivial modifications of the system state and the measurement results. This paper explores the ways in which quantum backaction can manifest in sequential measurements, including the role of measurement strength and the nature of the measurement process. The paper highlights the insight quantum foundation and the implications for quantum measurement and information processing.

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