论文标题

研究HL-LHC实验的P-MCZ薄硅微带探测器中混合辐照效应的研究

Investigation of Mixed Irradiation Effects in p-MCz Thin Silicon Microstrip Detector for the HL-LHC Experiments

论文作者

Patyal, Shilpa, Saini, Nitu, Kaur, Balwinder, Chatterjee, Puspita, Michael, Thresia, Srivastava, Ajay K.

论文摘要

在CERN RD50合作中进行了许多研发工作,以找出可以在HL-LHC,N和P-MCZ SI的严酷辐射环境中使用的SI探测器的最佳材料,该材料被确定为可以选择的2阶段型号soltation solety solettection的材料之一,可将其选择为2阶段的探测器。通过比较有关完整耗竭电压和泄漏电流与Shockley Read Read Hall的重组统计结果的实验​​数据的比较,提出了用于P-MCZ SI的高级四级深层混合辐照模型。在这项工作中,我们确定了使用SRH理论计算exp的较浅供体深度陷阱E30 K的有效引入速率。 NEFF并可以显示P -MCZ SI带检测器中空间电荷和电场分布的行为,并将其值与N -MCZ SI微带检测器中的浅供体深陷阱E30 K进行了比较。 P-MCZ SI辐射损伤中的预测不确定性混合辐射模型在完整的耗竭电压和泄漏电流中考虑。在实验和SRH结果中观察到非常好的一致性。这种辐射损伤模型还用于推断在薄P-MCZ SI微带探测器的不同混合(质子 +中子)上较高的辐射量上的全耗尽电压的值。

A lot of R & D work is carried out in the CERN RD50 Collaboration to find out the best material for the Si detectors that can be used in the harsh radiation environment of HL-LHC, n and p-MCz Si was identified as one of the prime candidates as a material for strip detector that can be chosen the phase 2 upgrade plan of the new Compact Muon Solenoid tracker detector in 2026. For the very first time, in this work, an advanced four level deep-trap mixed irradiation model for p-MCz Si is proposed by the comparison of experimental data on the full depletion voltage and leakage current to the Shockley Read Hall recombination statistics results on the mixed irradiated p-MCz Si PAD detector. In this work, we have determined the effective introduction rate ηeff of shallower donor deep trap E30 K using SRH theory calculations for exp. Neff and that can shown the behavior of space charges and electric field distribution in the p-MCz Si strip detector and compared its value with the Neff of shallower donor deep trap E30 K in the n -MCz Si microstrip detector. Prediction uncertainty in the p-MCz Si radiation damage mixed irradiation model considered in the full depletion voltage and leakage current. A very good agreement is observed in the experimental and SRH results. This radiation damage models also used to extrapolate the value of the full depletion voltage at different mixed (proton + neutron) higher irradiation fluences for the thin p-MCz Si microstrip detector.

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