论文标题
强大量子电路测试的自动测试模式生成
Automatic Test Pattern Generation for Robust Quantum Circuit Testing
论文作者
论文摘要
量子电路测试对于检测现实量子设备中的潜在故障至关重要，而测试过程本身也遭受了量子操作的不确定性和不可靠性。本文通过提出一个新的自动测试模式生成（ATPG）的框架来减轻问题，以对逻辑量子电路进行健全的测试。我们介绍了用于表示量子测试模式的稳定器投影仪分解（SPD），并使用仅Clifford的电路来构建测试应用（即状态准备和测量），这些电路在容忍耐故障的量子计算中所证明，它们相当强大且有效。但是，由于稳定器投影仪数量呈指数增长，通常很难生成SPD。为了避免这种困难，我们开发了SPD代算法，以及几种可以利用SPD的地方和稀疏性的加速技术。我们的算法的有效性通过1）在合理条件下的理论保证，2）对常用基准电路的实验结果，例如量子傅立叶变换（QFT），量子体积（QV）和IBM Qiskit中的Bernstein-Vazirani（BV）。
Quantum circuit testing is essential for detecting potential faults in realistic quantum devices, while the testing process itself also suffers from the inexactness and unreliability of quantum operations. This paper alleviates the issue by proposing a novel framework of automatic test pattern generation (ATPG) for robust testing of logical quantum circuits. We introduce the stabilizer projector decomposition (SPD) for representing the quantum test pattern, and construct the test application (i.e., state preparation and measurement) using Clifford-only circuits, which are rather robust and efficient as evidenced in the fault-tolerant quantum computation. However, it is generally hard to generate SPDs due to the exponentially growing number of the stabilizer projectors. To circumvent this difficulty, we develop an SPD generation algorithm, as well as several acceleration techniques which can exploit both locality and sparsity in generating SPDs. The effectiveness of our algorithms are validated by 1) theoretical guarantees under reasonable conditions, 2) experimental results on commonly used benchmark circuits, such as Quantum Fourier Transform (QFT), Quantum Volume (QV) and Bernstein-Vazirani (BV) in IBM Qiskit.
