论文标题
srruo $ _3 $薄膜的原子尺度结构的厚度和温度依赖性
Thickness and temperature dependence of the atomic-scale structure of SrRuO$_3$ thin films
论文作者
论文摘要
由于在复杂的氧化物外延层中存在的牢固的晶状特性关系,因此它们的电子和磁性特性可以通过原子尺度引起的结构扭曲来调节。通过底物或结构修改施加的外延菌株,可以在相干异互面子上影响修饰和控制,以适应膜基底对称的对称性。通常,这些作用与对层厚度的强烈依赖相结合,尤其是对于超薄层。此外,由于这些影响,结构的温度依赖性可能主要偏离大体的温度。使用高分辨率同步X射线X射线衍射和高分辨率电子显微镜的组合,研究了在NB掺杂的Srtio $ _3 $基质上生长的3至44个单位细胞厚铁磁$ _3 $膜的温度依赖性结构。这旨在阐明外部SRO层的有趣的磁性和磁转移特性,最近经过广泛的研究。发现氧气八人体倾斜和旋转很大程度上取决于温度,薄膜厚度以及距离膜 - 底物界面的距离。作为磁性和晶格结构之间耦合的惊人表现,在外延层的铁磁过渡温度下方观察到了不一致的8个单位细胞的铁磁过渡温度,类似于大量的铁磁Srrruo $ _3 $。
Due to the strong lattice-property relationships which exist in complex oxide epitaxial layers, their electronic and magnetic properties can be modulated by structural distortions induced at the atomic scale. The modification and control can be affected at coherent heterointerfaces by epitaxial strain imposed by the substrate or by structural modifications to accommodate the film-substrate symmetry mismatch. Often these act in conjunction with a strong dependence on the layer thickness, especially for ultrathin layers. Moreover, as a result of these effects, the temperature dependence of the structure may deviate largely from that of the bulk. The temperature-dependent structure of 3 to 44 unit cell thick ferromagnetic SrRuO$_3$ films grown on Nb-doped SrTiO$_3$ substrates are investigated using a combination of high-resolution synchrotron X-ray diffraction and high-resolution electron microscopy. This aims to shed light on the intriguing magnetic and magnetotransport properties of epitaxial SRO layers, subjected to extensive investigations lately. The oxygen octahedral tilts and rotations are found to be strongly dependent on the temperature, the film thickness, and the distance away from the film-substrate interface. As a striking manifestation of the coupling between magnetic order and lattice structure, the Invar effect is observed below the ferromagnetic transition temperature in epitaxial layers as thin as 8 unit cells, similar to bulk ferromagnetic SrRuO$_3$.