论文标题
电子发射显微照片分析的快速模式识别
Fast Pattern Recognition for Electron Emission Micrograph Analysis
论文作者
论文摘要
在这项工作中，开发了一种模式识别算法来处理和分析电子发射显微照片。给出了DC和RF发射的各种示例，以证明该算法适用性，以确定发射器空间位置和分布并计算明显的发射面积。该算法很快，只需$ \ sim $ 10秒即可处理和使用Intel Core i5的资源分析一个显微照片。
In this work, a pattern recognition algorithm was developed to process and analyze electron emission micrographs. Various examples of dc and rf emission are given that demonstrate this algorithm applicability to determine emitters spatial location and distribution and calculate apparent emission area. The algorithm is fast and only takes $\sim$10 seconds to process and analyze one micrograph using resources of an Intel Core i5.
