论文标题
通过角度分辨光光谱访问Operando设备中的光谱函数
Accessing the spectral function of in operando devices by angle-resolved photoemission spectroscopy
论文作者
论文摘要
以1〜 $μ$ m或更少的顺序（纳米角）以高空间分辨率的高空间分辨率进行角度分辨光发射光谱（ARPE）的进展开放了可能以这种微小的量表绘制固体功能的频谱功能，从而获得了材料'\ emph {本地}电器带和许多型电器互动的详细信息。最近，纳米棕榈已用于基于二维材料来研究简单的电子设备，并可能通过野外效应门进行调整载体类型和密度，而在通过设备中传递电流的同时。已证明纳米棕榈可以在这些情况下检测材料电子结构的可能变化，并且可以绘制局部掺杂，电导和迁移率。本文回顾了这些第一个\ emph {in Operando} arpes在设备上的结果，讨论了由此产生的新见解以及该技术未来发展的观点。
Progress in performing angle-resolved photoemission spectroscopy (ARPES) with high spatial resolution in the order of 1~$μ$m or less (nanoARPES) has opened the possibility to map the spectral function of solids on this tiny scale and thereby obtain detailed information on the materials' \emph{local} electronic band structure and many-body interactions. Recently, nanoARPES has been used to study simple electronic devices, based on two-dimensional materials, with the possibility of tuning the carrier type and density by field effect-gating, and while passing a current through the device. It was demonstrated that nanoARPES can detect possible changes in the materials' electronic structure in these situations and that it can map the local doping, conductance and mobility. This article reviews these first \emph{in operando} ARPES results on devices, discusses the resulting new insights, as well as the perspectives for future developments of the technique.
