论文标题

数字全息图的目标质量指标的全面绩效分析

Comprehensive Performance Analysis of Objective Quality Metrics for Digital Holography

论文作者

Ahar, Ayyoub, Birnbaum, Tobias, Chlipala, Maksymilian, Zaperty, Weronika, Mahmoudpour, Saeed, Kozacki, Tomasz, Kujawinska, Malgorzata, Schelkens, Peter

论文摘要

事实证明,数字全息图的客观质量评估是一项艰巨的任务。虽然从全息波场中记录的3D内容的感知质量的预测是一个开放的问题。渲染后的内容评估感知质量评估需要耗时的渲染步骤和许多可能的视口。在这项研究中,我们使用最近发布的HolODB数据库的96个傅立叶全息图来评估数字全息图上知名和最先进的图像质量指标的性能。我们将参考全息图与它们的扭曲版本进行了比较:(i)在呈现量化复合体波菲尔德的真实和虚构部分之前,(ii)在渲染后转换为傅立叶全息图(III)之后,(iii)在渲染后,在量化的数据的量化量量化后,以及随后使用Speckle sepeer sepeer noy的量化幅度。对于每个实验轨道,将质量指标预测与在2D屏幕上收集的平均意见分数(MOS),光场显示和全息显示器进行了比较。此外,提出了对结果的统计分析以及有关指标性能的讨论。测试表明,尽管对于每个测试轨道,与多组可用MOS相比,一些质量指标具有高度相关的性能,但在所有四个测试轨道上都没有表现出一贯的高性能。

Objective quality assessment of digital holograms has proven to be a challenging task. While prediction of perceptual quality of the recorded 3D content from the holographic wavefield is an open problem; perceptual quality assessment from content after rendering, requires a time-consuming rendering step and a multitude of possible viewports. In this research, we use 96 Fourier holograms of the recently released HoloDB database to evaluate the performance of well-known and state-of-the-art image quality metrics on digital holograms. We compare the reference holograms with their distorted versions: (i) before rendering on the real and imaginary parts of the quantized complex-wavefield, (ii) after converting Fourier to Fresnel holograms, (iii) after rendering, on the quantized amplitude of the reconstructed data, and (iv) after subsequently removing speckle noise using a Wiener filter. For every experimental track, the quality metric predictions are compared to the Mean Opinion Scores (MOS) gathered on a 2D screen, light field display and a holographic display. Additionally, a statistical analysis of the results and a discussion on the performance of the metrics are presented. The tests demonstrate that while for each test track a few quality metrics present a highly correlated performance compared to the multiple sets of available MOS, none of them demonstrates a consistently high-performance across all four test-tracks.

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