论文标题

在嘈杂的量子误差校正电路中对真实多部分纠缠的有效和强大的认证

Efficient and robust certification of genuine multipartite entanglement in noisy quantum error correction circuits

论文作者

Rodriguez-Blanco, Andrea, Bermudez, Alejandro, Müller, Markus, Shahandeh, Farid

论文摘要

确保量子误差校正(QEC)电路的正确功能对于在经受噪声的逼真量子处理器中实现容错至关重要。完全操作的QEC电路的第一个检查点是在物理Qubits的所有子系统中创建真正的多部分纠缠。我们介绍了一种有条件的见证技术,以证明真正的多部分纠缠(GME),该技术在子系统的数量中有效,并且重要的是,对实验噪声和缺陷很强。具体而言,我们证明,通过许多测量值也可以线性缩放,足以证明GME,对纠缠数量的纠缠检测。此外,我们的方法超出了将状态与双态状态的凸壳分开的标准程序,与以前的技术相比,精致和鲁棒性提高了。我们将我们的方法应用于距离三个拓扑颜色代码及其基于标志的耐故障版本的稳定器操作员的嘈杂读数。特别是,我们将电路对三种类型的噪声组合进行,即均匀的去极化噪声,两倍栅极的栅极去极化噪声和位叉测量噪声。我们将我们的方法与标准效率但效率低下的标准测试以及一对有效的证人进行比较,从而验证了我们方法的鲁棒性。最后但并非最不重要的一点是,我们将分析的完整翻译为被困的离子天然门集,使其适用于实验应用。

Ensuring the correct functioning of quantum error correction (QEC) circuits is crucial to achieve fault tolerance in realistic quantum processors subjected to noise. The first checkpoint for a fully operational QEC circuit is to create genuine multipartite entanglement across all subsystems of physical qubits. We introduce a conditional witnessing technique to certify genuine multipartite entanglement (GME) that is efficient in the number of subsystems and, importantly, robust against experimental noise and imperfections. Specifically, we prove that the detection of entanglement in a linear number of bipartitions by a number of measurements that also scales linearly, suffices to certify GME. Moreover, our method goes beyond the standard procedure of separating the state from the convex hull of biseparable states, yielding an improved finesse and robustness compared to previous techniques. We apply our method to the noisy readout of stabilizer operators of the distance-three topological color code and its flag-based fault-tolerant version. In particular, we subject the circuits to combinations of three types of noise, namely, uniform depolarizing noise, two-qubit gate depolarizing noise, and bit-flip measurement noise. We numerically compare our method with the standard, yet generally inefficient, fidelity test and to a pair of efficient witnesses, verifying the increased robustness of our method. Last but not least, we provide the full translation of our analysis to a trapped-ion native gate set that makes it suitable for experimental applications.

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