论文标题
快速与常规HAADF-STEM断层扫描：优势和挑战
Fast versus conventional HAADF-STEM tomography: advantages and challenges
论文作者
论文摘要
电子断层扫描是一种广泛使用的实验技术，用于分析三个维度各种材料的纳米尺度结构。不幸的是，根据实验的复杂性，对传统电子断层扫描倾斜系列的获取很容易占用一个小时或更长时间。因此，使用电子断层扫描，获得统计学上有意义的3D数据，研究不承受长时间采集或使用此技术进行原位3D表征的样品远非直接的。已经提出了各种采集策略来加速层析成像，并减少所需的电子剂量。这些方法包括在获取投影电影和一种混合，增量的方法中连续倾斜支架，从而结合了传统和连续技术的好处。在本文中，基于针对各种金属纳米颗粒的实验倾斜序列，将根据速度，分辨率和电子剂量进行实验比较不同的采集策略。
Electron tomography is a widely used experimental technique for analyzing nanometer-scale structures of a large variety of materials in three dimensions. Unfortunately, the acquisition of conventional electron tomography tilt series can easily take up one hour or more, depending on the complexity of the experiment. Using electron tomography, it is therefore far from straightforward to obtain statistically meaningful 3D data, to investigate samples that do not withstand long acquisition, or to perform in situ 3D characterization using this technique. Various acquisition strategies have been proposed to accelerate the tomographic acquisition, and reduce the required electron dose. These methods include tilting the holder continuously while acquiring a projection movie and a hybrid, incremental, methodology which combines the benefits of the conventional and continuous technique. In this paper, the different acquisition strategies will be experimentally compared in terms of speed, resolution and electron dose, based on experimental tilt series acquired for various metallic nanoparticles.
