论文标题
MERAM:基于磁电力FET的非挥发缓存存储器
MERAM: Non-Volatile Cache Memory Based on Magneto-Electric FETs
论文作者
论文摘要
Magneto-Electric FET(MEFET)是最近开发的CMOS FET,在逻辑和内存应用中为高速和低功率设计提供了有趣的特征。在本文中,我们首次提出了一个非易失性的2T-1Mefet存储器位单元,并带有单独的读写路径。我们表明,通过在设备,单元格和数组级别进行适当的共同设计,这种设计是快速非挥发缓存内存的有前途的候选者,称为Meram。为了进一步评估其在记忆系统中的性能,我们首次基于实验型的MEFET设备模型构建设备到架构的跨层评估框架,以定量分析和基准通过其他记忆技术进行定量分析和基准,包括其他记忆技术,包括挥发性记忆,包括挥发性记忆(即SRAM,EDRAM,EDRAM,EDRAM)和其他流行的不变效果(I. I. SOT-MRAM)。实验结果表明,梅拉姆具有较高的状态可区分性,而感官电流的差异几乎为36倍。 PARSEC基准套件的结果表明,与典型的6T SRAM和2T SOT-MRAM平台相比,Meram作为L2高速缓存替代品的平均能量面积潜伏期(EAT)产品降低了〜98 \%和〜70 \%。
Magneto-Electric FET (MEFET) is a recently developed post-CMOS FET, which offers intriguing characteristics for high speed and low-power design in both logic and memory applications. In this paper, for the first time, we propose a non-volatile 2T-1MEFET memory bit-cell with separate read and write paths. We show that with proper co-design at the device, cell and array levels, such a design is a promising candidate for fast non-volatile cache memory, termed as MERAM. To further evaluate its performance in memory system, we, for the first time, build a device-to-architecture cross-layer evaluation framework based on an experimentally-calibrated MEFET device model to quantitatively analyze and benchmark the proposed MERAM design with other memory technologies, including both volatile memory (i.e. SRAM, eDRAM) and other popular non-volatile emerging memory (i.e. ReRAM, STT-MRAM, and SOT-MRAM). The experiment results show that MERAM has a high state distinguishability with almost 36x magnitude difference in sense current. Results for the PARSEC benchmark suite indicate that as an L2 cache alternative, MERAM reduces Energy Area Latency (EAT) product on average by ~98\% and ~70\% compared with typical 6T SRAM and 2T SOT-MRAM platforms, respectively.