论文标题
随机步行,用于建模多核纤维串扰和阶跃分布表征
Random Walk for modelling Multi Core Fiber cross-talk and step distribution characterisation
论文作者
论文摘要
已经提出了一个新型的基于核心间串扰(IC-XT)表征的多核纤维的模型,该模型已经提出了能够准确代表实验ICXT的时间域分布和频域表示的多核纤维。已经证明,该模型是文献中最广泛使用的模型的概括,当样本数量和测量时间窗口倾向于无穷大时,它将收敛。此外,该模型与统计分析(例如短期平均串扰(STAXT))一致,保持相同的收敛属性,并且显示出几乎独立于时间风格。为了验证该模型,已经提出了DB结构域中ICX的新型表征(基于伪随机步行),并评估了其步骤分布的统计属性。执行的分析表明,这种表征能够以99.3%的精度拟合每种类型的信号源。事实证明,对于时间窗口长度,温度和其他信号特性,例如符号率和伪随机位流(PRB)长度,它也非常健壮。获得的结果表明,该模型能够使用短的观察时间来传达大多数相关信息,从而适合IC-XT的表征和核心对源信号分类。使用机器学习(ML)技术进行源信号分类,我们从经验上证明,与传统统计方法相比,该技术具有更多有关IC-XT的信息。
A novel random walk based model for inter-core cross-talk (IC-XT) characterization of multi-core fibres capable of accurately representing both time-domain distribution and frequency-domain representation of experimental IC-XT has been proposed. It was demonstrated that this model is a generalization of the most widely used model in literature to which it will converge when the number of samples and measurement time-window tend to infinity. In addition, this model is consistent with statistical analysis such as short term average crosstalk (STAXT), keeping the same convergence properties and it showed to be almost independent to time-window. To validate this model, a new type of characterization of the IC-XT in the dB domain (based on a pseudo random walk) has been proposed and the statistical properties of its step distribution have been evaluated. The performed analysis showed that this characterization is capable of fitting every type of signal source with an accuracy above 99.3%. It also proved to be very robust to time-window length, temperature and other signal properties such as symbol rate and pseudo-random bit stream (PRBS) length. The obtained results suggest that the model was able to communicate most of the relevant information using a short observation time, making it suitable for IC-XT characterization and core-pair source signal classification. Using machine-learning (ML) techniques for source-signal classification, we empirically demonstrated that this technique carries more information regarding IC-XT than traditional statistical methods.