论文标题
硅底物在相干显微镜中显着改变偶极 - 偶极分辨率
Silicon substrate significantly alters dipole-dipole resolution in coherent microscope
论文作者
论文摘要
通过达到二元格林功能的解决方案，研究了底物在成像性能中的影响，在该功能中，底物在样品区域中建模为一半空间。然后，理论和数值分析是根据放大倍率，景深和分辨率进行的。考虑了各种设置，包括偶极子的位置，底物与焦平面和偶极极化的距离。还提供了测量$ z $偏振偶极子分辨率的方法，因为不能直接应用修改后的雷利限制。用浸入水物镜研究硅基板和玻璃基板。硅和水之间的高对比度会导致成像的重大干扰。
Influences of a substrate below samples in imaging performances are studied by reaching the solution to the dyadic Green's function, where the substrate is modeled as half space in the sample region. Then, theoretical and numerical analysis are performed in terms of magnification, depth of field, and resolution. Various settings including positions of dipoles, the distance of the substrate to the focal plane and dipole polarization are considered. Methods to measure the resolution of $z$-polarized dipoles are also presented since the modified Rayleigh limit cannot be applied directly. The silicon substrate and the glass substrate are studied with a water immersion objective lens. The high contrast between silicon and water leads to significant disturbances on imaging.
