论文标题
验证使用Tokamak等离子体的K-Spectra的He-和Li样离子的原子数据验证
Verification of atomic data for He- and Li-like ions employing K-spectra from the tokamak plasma
论文作者
论文摘要
X射线发射K-Spectra的高度充电和类似于Li的氩离子在培养基Tokamak上以高光谱,空间和时间分辨率记录下来,以开发一种自洽的方法(SCA),以获取有关等离子体参数的信息,以获取有关验证(估计估算)对谱图的验证(估计),以及对光谱数据的准确性,以及对光谱诠释的准确性,以及对光谱诠释的措施。该方法是基于通过两种免费反转方法在半经验的``光谱模型''(SM)框架中解决这些光谱的频谱反问题。通过根据计算和校正的原子数据比较和分析测量和合成光谱来证明SCA是合理的。分析和验证了三种不同的He和Li样氩离子原子数据。 SCA允许我们以5--10 \%以内的精度来验证计算原子数据的方法。用校正原子数据计算的光谱与在10 \%的实验准确性内在广泛的血浆条件下测得的光谱一致。校正的原子数据使得可以对等离子体参数进行准确的诊断:血浆温度和Tokamak血浆中的相对离子丰度。该过程还提供了一种方法,可以在5 \%以内的高精度确定血浆核的温度,这与基于电子回旋子发射的诊断技术一致。通过应用光谱和杂质传输模型获得的相对离子丰度在实验误差中是一致的。提出的结果表明,Tokamak等离子体的X射线光谱是可以高精度验证原子数据和精确等离子体诊断的有效工具。
X-ray emission K-spectra of highly charged He- and Li-like argon ions recorded with high spectral, spatial, and temporal resolution at the TEXTOR tokamak were employed to develop a self-consistent approach (SCA) for deriving information on plasma parameters and the verification (estimation of accuracy) of both atomic data, needed for spectra interpretation, and methods of their calculation. The approach is based on solving the spectral inverse problem for these spectra in the framework of the semi-empirical ``spectroscopic model'' (SM) by means of two complimentary inversion methods. The SCA was justified by comparing and analyzing measured and synthetic spectra on the basis of the calculated and corrected atomic data. The three different sets of atomic data for He- and Li-like argon ions were analyzed and verified. The SCA allowed us to verify the methods for calculating the atomic data with an accuracy within of 5--10\%. The spectra calculated with corrected atomic data are in agreement with the spectra measured in the wide range of plasma conditions within the experimental accuracy of 10\%. Corrected atomic data made it possible to perform an accurate diagnostics of plasma parameters: plasma temperatures and relative ion abundances in the tokamak plasma. This procedure provided also a method for determining the temperature of the plasma core with high accuracy within 5\% in a good agreement with the diagnostics technique based on the electron cyclotron emission. The relative ion abundances obtained by the application of the spectroscopic and impurity transport model are in agreement within the experimental errors. The presented results show that the X-ray spectroscopy of tokamak plasma is an effective tool for both high accuracy verification of atomic data and precision plasma diagnostics.