论文标题
双重拓扑绝缘器设备具有障碍鲁棒性
Dual Topological Insulator Device with Disorder Robustness
论文作者
论文摘要
二维NA $ _3 $ BI是一个受时间反转和镜像对称性保护的双拓扑绝缘子,从而为设备设计提供了有前途的平台。但是,实际上,拓扑设备的设计受到对混乱和温度的敏感性的阻碍。我们在存在内在缺陷的情况下研究Na $ _3 $ bi的拓扑特性,研究边缘状态的稳健性和所得的运输特性。我们采用了递归绿色的功能技术,可实现与实验合成材料相当的无序系统的研究。我们将发现结合起来提出拓扑绝缘器设备,其中固有的缺陷用于过滤琐碎的体积状态的响应。这会导致在各种电子温度范围内的稳定电导,并通过垂直电场控制。我们的建议是一般的,可以设计各种双重拓扑绝缘器设备。
Two-dimensional Na$_3$Bi is a dual topological insulator protected by time-reversal and mirror symmetry, resulting in a promising platform for devices design. However, in reality, the design of topological devices is hindered by a sensitivity against disorder and temperature. We study the topological properties of Na$_3$Bi in the presence of intrinsic defects, investigating the robustness of the edge states and the resulting transport properties. We apply a recursive Green's function technique enabling the study of disordered systems with lengths comparable to experimentally synthesized materials, in the order of micrometers. We combine our findings to propose a topological insulator device, where intrinsic defects are used to filter the response of trivial bulk states. This results in a stable conductance throughout a large range of electronic temperatures, and controllable by a perpendicular electric field. Our proposal is general, enabling the design of various dual topological insulators devices.