论文标题
使用弱值直接表征量子测量
Direct Characterization of Quantum Measurements using Weak Values
论文作者
论文摘要
时间对称的形式主义赋予了弱测量及其结果,弱价值和许多独特的特征。特别是,它允许对量子状态进行直接断层扫描,而无需诉诸复杂的重建算法,并为波函数和密度矩阵提供了操作含义。在这里,我们提出并通过实验表明测量机构的直接层析成像,通过采取弱测量形式主义的向后方向。我们的协议与任意测量强度严格合作,这提供了提高的准确性和精确度。可以考虑到测量运算符的完整性条件,从而进一步提高精度,这也确保了我们协议对任意量子测量的表征的可行性。我们的工作为量子状态与测量值之间的对称性提供了新的见解,以及一种表征测量设备的有效方法。
The time-symmetric formalism endows the weak measurement and its outcome, the weak value,many unique features. In particular, it allows a direct tomography of quantum states without resort to complicated reconstruction algorithms and provides an operational meaning to wave functions and density matrices. Here, we propose and experimentally demonstrate the direct tomography of a measurement apparatus by taking the backward direction of weak measurement formalism. Our protocol works rigorously with the arbitrary measurement strength, which offers an improved accuracy and precision. The precision can be further improved by taking into account the completeness condition of the measurement operators, which also ensures the feasibility of our protocol for the characterization of the arbitrary quantum measurement. Our work provides new insight on the symmetry between quantum states and measurements, as well as an efficient method to characterize a measurement apparatus.