论文标题
石墨烯的通用迁移特性源自电子/孔散射的电离杂质
Universal mobility characteristics of graphene originating from electron/hole scattering by ionised impurities
论文作者
论文摘要
原始石墨烯和基于石墨烯的异质结构如果其表面含有很少的电子散射杂质,则具有极高的电子迁移率和电导率。在这里,我们揭示了石墨烯的载体迁移率与载体密度变化之间的普遍联系。我们的石墨烯电导率模型基于载体密度及其不确定性的卷积,该模型重现了观察到的普遍性。将单个电导测量作为输入,该模型准确地预测了多种报告的石墨烯样品的电导与载体密度曲线的全部形状。我们通过数值求解玻尔兹曼传输方程来详细分析带电杂质散射对载流子迁移率的影响来验证卷积模型。在此模型中,我们还包括光学声子,该光子放松高能荷载体,以使小杂质密度。我们的数值和分析结果既捕获了实验中观察到的普遍性,又提供了一种估计石墨烯设备的所有关键运输参数的方法。我们的结果表明了如何预测和控制载流子的活动,从而提供了工程2D材料和异质结构的特性的见解。
Pristine graphene and graphene-based heterostructures exhibit exceptionally high electron mobility and conductance if their surface contains few electron-scattering impurities. Here, we reveal a universal connection between graphene's carrier mobility and the variation of its electrical conductance with carrier density. Our model of graphene conductivity is based on a convolution of carrier density and its uncertainty, which reproduces the observed universality. Taking a single conductance measurement as input, this model accurately predicts the full shape of the conductance versus carrier density curves for a wide range of reported graphene samples. We verify the convolution model by numerically solving the Boltzmann transport equation to analyse in detail the effects of charged impurity scattering on carrier mobility. In this model, we also include optical phonons, which relax high-energy charge carriers for small impurity densities. Our numerical and analytical results both capture the universality observed in experiment and provide a way to estimate all key transport parameters of graphene devices. Our results demonstrate how the carrier mobility can be predicted and controlled, thereby providing insights for engineering the properties of 2D materials and heterostructures.