论文标题
无定形二氧化物膜的热处理中的结构动力学
Structural dynamics in thermal-treatment of amorphous indium-oxide films
论文作者
论文摘要
热治疗的无定形二氧化物膜用于各种基础研究中，以调节系统障碍。在此过程中，给定样品的耐药性降低，而其无定形结构和化学成分则保留。该过程的主要影响是系统密度的增加，这又导致了改善的原子间重叠，这很容易被检测到改善的电导率。在遇到压力的其他无定形系统的研究中也观察到了类似的效果。在当前的工作中，我们表明，对热治疗的反应，以与其他无序和无定形系统进行的压力实验相似的方式对热治疗的反应反应反应的拉曼谱。我们介绍了一项研究，如何通过在热处理的各个阶段监测抗氧化膜的电阻与时间的时间来改变系统动力学。样品抗性的时间依赖性符合拉伸指数定律，其参数随着进一步的退火而系统地改变。讨论了这些结果对缓慢的动态现象的含义，讨论了由Kohlrausch定律管辖的含义。
Thermally-treating amorphous indium-oxide films is used in various basic studies as a means of tuning the system disorder. In this process the resistance of a given sample decreases while its amorphous structure and chemical composition is preserved. The main effect of the process is an increase in the system density which in turn leads to improved interatomic overlap which is easily detected as improved conductivity. A similar effect has been observed in studies of other amorphous systems that were subjected to pressure. In the current work we show that the Raman spectra of amorphous indium-oxide change in response to thermal-treatment in a similar way as in pressure experiments performed on other disordered and amorphous systems. We present a study of how thermal-treatment changes the system dynamics by monitoring the resistance versus time of indium-oxide films following various stages of thermal-treatment. The time dependence of the sample resistance fits the stretched exponential law with parameters that change systematically with further annealing. Implication of these results to slow dynamics phenomena that are governed by the Kohlrausch's law are discussed.
