论文标题
在两相氙时间投影室中歧视电子后坐力与核后坐力
Discrimination of electronic recoils from nuclear recoils in two-phase xenon time projection chambers
论文作者
论文摘要
我们使用2013年和2014 - 16年运行的大型地下氙(LUX)实验的校准数据对液体/气体氙时间投影室中的电子后坐力与核后坐力区分进行了全面分析。我们观察到随着事件能量的增加,可以观察到强大的电荷到光线歧视增强。对于S1 = 120检测到的光子的事件,即等同于$ \ sim $ 100 keV的核后坐力能量,我们在核后线子信号接受50%时观察到$ <10^{ - 5} $的电子后坐背景接受度。我们还观察到歧视能力的适度电场依赖性,该歧视能力在本研究中探索的田间范围内达到约300 v/cm的峰值(50-500 v/cm)。在S1 = 1-80 PHD的WIMP搜索区域中,我们观察到的最小电子后坐力泄漏为$ {(7.3 \ pm0.6)\ times10^{ - 4}} $,用于240-290 v/cm的漂移场获得。 Pulse shape discrimination is utilized to improve our results, and we find that, at low energies and low fields, there is an additional reduction in background leakage by a factor of up to 3. We develop an empirical model for recombination fluctuations which, when used alongside the Noble Element Scintillation Technique (NEST) simulation package, correctly reproduces the skewness of the electronic recoil data.我们使用此更新的模拟来研究电子后坐力带的宽度,发现其主要的贡献来自电子离子重组的波动,随后是S1信号的波动,S2信号的波动,以及给定能量沉积物产生的量子总数的波动。
We present a comprehensive analysis of electronic recoil vs. nuclear recoil discrimination in liquid/gas xenon time projection chambers, using calibration data from the 2013 and 2014-16 runs of the Large Underground Xenon (LUX) experiment. We observe strong charge-to-light discrimination enhancement with increased event energy. For events with S1 = 120 detected photons, i.e. equivalent to a nuclear recoil energy of $\sim$100 keV, we observe an electronic recoil background acceptance of $<10^{-5}$ at a nuclear recoil signal acceptance of 50%. We also observe modest electric field dependence of the discrimination power, which peaks at a field of around 300 V/cm over the range of fields explored in this study (50-500 V/cm). In the WIMP search region of S1 = 1-80 phd, the minimum electronic recoil leakage we observe is ${(7.3\pm0.6)\times10^{-4}}$, which is obtained for a drift field of 240-290 V/cm. Pulse shape discrimination is utilized to improve our results, and we find that, at low energies and low fields, there is an additional reduction in background leakage by a factor of up to 3. We develop an empirical model for recombination fluctuations which, when used alongside the Noble Element Scintillation Technique (NEST) simulation package, correctly reproduces the skewness of the electronic recoil data. We use this updated simulation to study the width of the electronic recoil band, finding that its dominant contribution comes from electron-ion recombination fluctuations, followed in magnitude of contribution by fluctuations in the S1 signal, fluctuations in the S2 signal, and fluctuations in the total number of quanta produced for a given energy deposition.