论文标题
电子束诱导电流观察到的异质结构纳米线中的热载体分离
Hot-Carrier Separation in Heterostructure Nanowires observed by Electron-Beam Induced Current
论文作者
论文摘要
对于诸如热伏光电检测和第三代光伏的应用,半导体中热载体的分离是感兴趣的。半导体纳米线为有效的热载体分离提供了几种潜在的优势,例如:与散装相比,基于异质结构的带有工程的高度控制和灵活性,热载体温度升高,以及适合局部控制光吸收的几何形状。实际上,已经观察到在全球照明下产生电力的INAS纳米线,其开路电压超过了冲击式 - 盖塞斯尔的极限。为了更详细地了解这种行为,有必要控制纳米线中电子孔对的精确位置。在这项工作中,我们以高空间分辨率执行电子束诱导的电流测量值,并证明INP屏障在提取能量电子中的作用。我们根据热载体分离来解释结果,并提取热载体均值自由路径的估计。
The separation of hot carriers in semiconductors is of interest for applications such as thermovoltaic photodetection and third-generation photovoltaics. Semiconductor nanowires offer several potential advantages for effective hot-carrier separation such as: a high degree of control and flexibility in heterostructure-based band engineering, increased hot-carrier temperatures compared to bulk, and a geometry well suited for local control of light absorption. Indeed, InAs nanowires with a short InP energy barrier have been observed to produce electric power under global illumination, with an open-circuit voltage exceeding the Shockley-Queisser limit. To understand this behaviour in more detail, it is necessary to maintain control over the precise location of electron-hole pair-generation in the nanowire. In this work we perform electron-beam induced current measurements with high spatial resolution, and demonstrate the role of the InP barrier in extracting energetic electrons. We interprete the results in terms of hot-carrier separation, and extract estimates of the hot carrier mean free path.