论文标题
DFSSD：深层故障和浅层二元性，这是一种强大的混淆解决方案，用于有限访问扫描链的电路
DFSSD: Deep Faults and Shallow State Duality, A Provably Strong Obfuscation Solution for Circuits with Restricted Access to Scan Chain
论文作者
论文摘要
在本文中，我们介绍了DFSSD，这是一种新型的逻辑锁定解决方案，用于顺序和FSM电路，对扫描链有限制（锁定）访问。 DFSSD结合了两种用于混淆的技术：（1）深层故障和（2）浅层双重性。两种技术均专门设计用于基于有界模型检查的顺序SAT攻击。浅色状态二元性防止连续的SAT攻击在不运行详尽无限的模型检查器的情况下进行捷径以提早终止，以评估是否可以终止攻击。另一方面，深层故障为设计师提供了一种技术，可以在合理的时间内通过连续的SAT（和有限的模型检查器）攻击来构建深层但可恢复的故障。
In this paper, we introduce DFSSD, a novel logic locking solution for sequential and FSM circuits with a restricted (locked) access to the scan chain. DFSSD combines two techniques for obfuscation: (1) Deep Faults, and (2) Shallow State Duality. Both techniques are specifically designed to resist against sequential SAT attacks based on bounded model checking. The shallow state duality prevents a sequential SAT attack from taking a shortcut for early termination without running an exhaustive unbounded model checker to assess if the attack could be terminated. The deep fault, on the other hand, provides a designer with a technique for building deep, yet key recoverable faults that could not be discovered by sequential SAT (and bounded model checker based) attacks in a reasonable time.
