论文标题
超音速喷气机产生的准晶体和结晶稀有气体簇:射流聚类水平对阴极发光光谱的影响
Quasicrystalline and crystalline rare-gas clusters produced in supersonic jets: Impact of the jet clustering level on cathodoluminescence spectra
论文作者
论文摘要
本文提出了一种研究一种新的方法,用于研究在耗尽真空的超音速喷气机中产生的无底物稀有气体簇的阴极发光光谱。该方法考虑了喷气机中簇的物质的比例,用于定量分析中性和带电的进符络合物(RG2)*和(rg4+)*的发光带的综合强度(RG2)*和(RG4+)*,用于三个稀有气体的纳米群(RG = ar,kr,kr和Xe)的纳米群体(RG = AR,XE)的平均水平(kr,kr,xe)(XE)的平均水平(kr,kr,xe)(XE)的平均水平(kr,kr,xe)(XE)的平均水平(XE)平均水平(XE)(kr,kr,xe)(Xe)平均水平(XE)。从2到13 nm不等。群集物质的量影响频带的集成强度的绝对值,被证明与射流中簇的平均大小的对数成正比。对归一化强度的分析使我们能够从光谱上找到两个平均大小的AR,KR和XE纳米簇的范围,根据电子衍射研究,它们可以分配给簇中的icosrystalline Icosrystalline iCosahedrine contalline contalline FCC结构,并在群集中找到群集大小范围的群集尺寸范围。我们表明,在FCC群集中,中性分子的发光(RG2)*来自簇的体积内,而带电的准分子复合物(RG4+)*主要来自地下层。
The paper proposes a new approach to studying cathodoluminescence spectra of substrate-free rare-gas clusters produced in supersonic jets exhausting into a vacuum. The approach, which takes into account the fraction of the clustered substance in the jet, is applied to quantitatively analyze integrated intensities of the luminescence bands of the neutral and charged excimer complexes (Rg2)* and (Rg4+)* measured for nanoclusters of three rare gases (Rg = Ar, Kr, and Xe) with average sizes ranging from 100 to 18000 atoms per clusters (diameters varying from 2 to 13 nm). The amount of the clustered substance, which affects the absolute values of integrated intensity of the bands, is shown to be proportional to the logarithm of the average size of clusters in the jet. Analysis of normalized intensities allowed us to spectroscopically find two ranges of average sizes of Ar, Kr, and Xe nanoclusters which, in accordance with the electron diffraction studies, can be assigned to quasicrystalline icosahedral and crystalline fcc structures in clusters, as well as to find the cluster size range in which both structures coexist. We show that in fcc clusters the luminescence of the neutral molecules (Rg2)* comes from within the volume of the cluster, while the charged excimer complexes (Rg4+)* emit mostly from subsurface layers.